The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

Dec. 10, 2007
Applicant:

Robert Jennings, Andover, MA (US);

Inventor:

Robert Jennings, Andover, MA (US);

Assignee:

Cytyc Corporation, Marlborough, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A stage for supporting a specimen slide and for calibrating a microscope includes a base and a calibration component integral with the base. The calibration component includes at least one calibration element for positional calibration and at least one calibration element for optical calibration. Calibration of the microscope can be performed without the need for independent calibration slides. The calibration component may be a glass calibration component or may be defined by a calibration element formed or etched through the base.


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