The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Jun. 14, 2007
Alexander Berestov, San Jose, CA (US);
Kenichi Nishio, Yokohama, JP;
Ted J. Cooper, Sunnyvale, CA (US);
Masaya Kinoshita, Yokohama, JP;
Ting Zhang, Tokyo, JP;
Alexander Berestov, San Jose, CA (US);
Kenichi Nishio, Yokohama, JP;
Ted J. Cooper, Sunnyvale, CA (US);
Masaya Kinoshita, Yokohama, JP;
Ting Zhang, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Sony Electronics Inc., Park Ridge, NJ (US);
Abstract
A system for and method of calibrating an imaging device efficiently is described herein. The imaging device acquires an image of an object that is more than one color. The information acquired is then transferred to a computing device. The information is then used to generate a set of data which represents information which was not acquired in the image. The set of data is generated based on statistical prediction using a training data set. Using acquired image information and the set of data, an imaging device is able to be calibrated. Since the process of calibration utilizing this method only requires one image to be acquired and a reduced set of image information to be sent to the computing device, the process is more efficient than previous implementations.