The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Jul. 28, 2006
Eung Je Woo, Seongnam-si, KR;
Dong IN OH, Yongin-si, KR;
Jin Keun Seo, Seoul, KR;
OH IN Kwon, Seoul, KR;
Eung Je Woo, Seongnam-si, KR;
Dong In Oh, Yongin-si, KR;
Jin Keun Seo, Seoul, KR;
Oh In Kwon, Seoul, KR;
Abstract
A system for electrical impedance tomography and method thereof are disclosed, by which electrical characteristics within a measurement target can be precisely detected. The present invention includes the steps of injection a current to a measurement target via at least one electrode pair selected form a plurality of electrodes () attached to the measurement target, detecting voltage of a surface of the measurement target using a plurality of voltmeters () connected to the electrodes that are not selected, respectively, adjusting gains of the voltmeters according to maximum values of the detected voltages, respectively, amplifying the detected voltages using the gain-adjusted voltmeters, respectively, and imaging an internal part of the measurement target based on the amplified voltages.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile