The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

Jun. 10, 2008
Applicants:

Mark Wegmuller, Zurich, CH;

Peter Ehbets, Zurich, CH;

Beat Frick, Tufistrasse, CH;

Inventors:

Mark Wegmuller, Zurich, CH;

Peter Ehbets, Zurich, CH;

Beat Frick, Tufistrasse, CH;

Assignee:

X-Rite Europe GmbH, Regensdorf, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for measuring the colour of printed samples by measuring a first spectral proportion of the total spectral reflection factor of a sample by illuminating the sample with light having no UV element are provided. The methods calculate a spectral correction factor by making allowance for the characterisation data of the brightened substrate and the spectral properties of a selected type of illuminating light, adding the spectral correction factor to the first spectral proportion to obtain the total spectral reflection factor of the measured sample. The methods further evaluate the total spectral reflection factor on the basis of measurements taken with illuminating light with no UV element and with UV light only on a limited set of measurement samples, especially on the non-printed substrate only (paper whiteness).


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