The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Oct. 08, 2004
Applicants:
Lee Chow, Orlando, FL (US);
Guang-yu Chai, Orlando, FL (US);
Inventors:
Lee Chow, Orlando, FL (US);
Guang-Yu Chai, Orlando, FL (US);
Assignee:
University of Central Florida Research Foundation, Inc., Orlando, FL (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 11/22 (2006.01); C23C 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An easy and controllable method and system to attach a carbon nanotube to a scanning probe tip such as a scanning probe microscopy (SPM) tip using a focus ion beam (FIB) technique. The method and system includes selecting a carbon fiber by a Focus Ion Beam micromanipulator, picking up the carbon fiber with the nanotube tip, forming a slot on an SPM tip, and inserting the carbon fiber with the nanotube tip into the slot.