The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

May. 31, 2005
Applicants:

Daniel B. Roitman, Menlo Park, CA (US);

Gregory D. Vanwiggeren, San Jose, CA (US);

Inventors:

Daniel B. Roitman, Menlo Park, CA (US);

Gregory D. VanWiggeren, San Jose, CA (US);

Assignee:

Sierra Sensors GmbH, Hamburg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A droplet sample holder, especially a sample holder for use in a measuring instrument utilizing surface plasmon resonance. The sample holder reduces or minimizes the measurement distortion result of the droplet 'pherpheral concentration effect' by surrounding the analysis zone with a wettable (hydrophilic) zone that captures the periphery of the droplet to keep the pheriphery of the droplet and the increased concentration of the analyte out of the analysis zone. The wettable zone is surrounded by a nonwettable (hydrophobic) zone that restricts the periphery of the droplet to analysis zone and the wettable zone.


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Roitman, Daniel. (2010). Sample holder for surface plasmon resonance measuring instruments (U.S. Patent No. 7846396). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7846396

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