The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Dec. 06, 2004
Mordechai Bliweis, Haifa, IL;
Uri Amir, Or Yehuda, IL;
Nir Berzak, Zikhron-Yaakov, IL;
Yura Leybin, Haifa, IL;
Shimon Livneh, Kiryat-Tivon, IL;
Mordechai Bliweis, Haifa, IL;
Uri Amir, Or Yehuda, IL;
Nir Berzak, Zikhron-Yaakov, IL;
Yura Leybin, Haifa, IL;
Shimon Livneh, Kiryat-Tivon, IL;
Galil Medical Ltd., Yokneam, IL;
Abstract
The present invention is of device, system, and method for cooling and heating an operating tip of a cryoprobe using a single source of compressed gas. Cooling of the operating tip is effected by Joule-Thomson expansion of a high-pressure cooling gas through a Joule-Thomson orifice into an expansion chamber. Heating of the operating tip is effected by electrical resistance heating. In preferred embodiments, heating of the operating tip is effected by electrical resistance heating of low-pressure gas flowing towards the operating tip. Preferably, gas from a single gas source is supplied to the probe during both cooling and heating phases, a cooling gas being supplied at high pressure when used for cooling and at low pressure when used for heating. Low-pressure gas supplied during the heating phase is heated as it flows towards the operating tip, preferably by electrical resistance heating within the body of the probe. A single gas input lumen is used during both cooling and heating phases to transport gas into the probe, and a single gas exhaust lumen is used during both cooling and heating phases to conduct gas out of the probe.