The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2010
Filed:
Sep. 29, 2009
Toshihiro Iwai, Itabashi-ku, JP;
Toshihiro Iwai, Itabashi-ku, JP;
Kabushiki Kaisha TOPCON, Itabashi-ku, Tokyo, JP;
Abstract
A lens shape measuring method includes: bringing a feeler into contact with an outer peripheral surface of a spectacle lens, the outer peripheral surface corresponding to a lens shape of spectacles, the feeler being rotatable about a rotation axis and movable forward and backward relative to the rotation axis in a radial direction, and, while keeping the contact state, moving the feeler along a contact surface of the feeler with the lens shape in a circumferential direction, to measure radii ρi (i=0, 1, 2, . . . n) of the lens shape over an entire circumference of thereof, the radii ρi representing change in distance from a geometric center of the lens shape to the feeler, a measurement region of the lens shape being divided into multiple sub-regions, and within each of the sub-regions, the rotation axis line being moved to a position to cause the feeler to measure the lens shape within the sub-region.