The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

Jan. 31, 2006
Applicant:

Edmund L. Russell, Danville, CA (US);

Inventor:

Edmund L. Russell, Danville, CA (US);

Assignee:

Oracle America, Inc., Redwood City, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 17/10 (2006.01); G06F 7/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for identifying specification window violations for a system is described. The method includes generating a sample set of input parameters. The system is simulated using the sample set to generate an output set. A mathematical model is best-fit to the output set. A set of desirability functions is defined to an out-of-spec condition. The model is then searched using the desirability functions to identify a worst-case data point. The worst-case data point can then be determined as either being within specification or out of specification.


Find Patent Forward Citations

Russell, Edmund. (2010). Specification window violation identification with application in semiconductor device design (U.S. Patent No. 7844926). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7844926

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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