The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

Feb. 13, 2008
Applicants:

Jeffrey G. Hemmett, Bolton Valley, VT (US);

Mukesh Kumar, Fairfax, VT (US);

Wayne H. Woods, Jr., Burlington, VT (US);

Cole E. Zemke, Essex Junction, VT (US);

Inventors:

Jeffrey G. Hemmett, Bolton Valley, VT (US);

Mukesh Kumar, Fairfax, VT (US);

Wayne H. Woods, Jr., Burlington, VT (US);

Cole E. Zemke, Essex Junction, VT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G21C 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for distributing a random variable by spatial interpolation with statistical corrections. The method includes assigning a numerical value of the random variable at each vertex of an array of equilateral triangles formed in a planar coordinate frame and defining a plurality of test points at respective spatial locations in the planar coordinate frame that are bounded by the array of equilateral triangles. A numerical value of the random variable is distributed at each of the test points by spatial interpolation from one or more of the numerical values of the random variable assigned at each vertex of the array of equilateral triangles. The method further includes adjusting the numerical value of the random variable distributed at each of the test points with a respective correction factor.


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