The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2010
Filed:
Feb. 23, 2004
Wei Du, Springfield, VA (US);
Wei Du, Springfield, VA (US);
First American Real Estate Solutions, LLC, Westlake, TX (US);
Abstract
Method of assessing population with a spatially-stratified random sample comprising creating a grid on a study area, the grid being defined by target grid points to form grid cell, dividing each grid cell into a series of sub-grid cells, each of the series of sub-grid cells being identified from left to right and bottom to top within each of the grid cells, identifying and listing each sub-grid cell that intersects the study area, the list of sub-grid cells being sequences in the same order as the grid cells and the sub-grid cells, dividing the sub-grid list into sections, each of the sections being configured to have substantially equal numbers of sub-grid cells, and the number of sections being equal to the number of targeted grid points, and selecting a random sub-grid cell from each section of sub-grid cells to obtain the spatially-stratified random sample.