The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2010
Filed:
Sep. 07, 2005
Angela E. Overman, Derry, NH (US);
Eric S. Noya, Groton, MA (US);
Jeffrey T. Wong, Newton, MA (US);
Broadcom Corporation, Irvine, CA (US);
Abstract
Self-generated automated tests can use a pseudo-random number generator to select one or more arguments that are passed to programs and scripts. The random arguments are driven by a configuration file where the limits for the parameters are defined. Multidimensional functions with multidimensional parameters can be tested. Test duration can be limited by time, number of iterations, or by any of the multidimensional functions or parameters. A pseudo-random seed for each test is recorded so that a test case can be reproduced if a failure is detected or otherwise.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile