The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2010
Filed:
Sep. 08, 2006
Applicant:
Steven A. Africk, Newton, MA (US);
Inventor:
Steven A. Africk, Newton, MA (US);
Assignee:
Other;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of measuring the compressibility, and/or the density, of small particles, and especially nano-particles, in suspension is described. The static method uses steady pressures and measures the d-c (static) compressibility of particles. The ultrasonic method utilizes an ultrasonic pulsed doppler system to measure the compressibility of particles at ultrasonic frequencies, which may differ from static values. These methods can also be used together to provide overlapping and complementary information about the particles. In addition, the ultrasonic pulsed doppler system also provides a way to measure particle density.