The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

Jul. 08, 2009
Applicants:

Taichi Sato, Kyoto, JP;

Kenji Mizutani, Kyoto, JP;

Inventors:

Taichi Sato, Kyoto, JP;

Kenji Mizutani, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
Abstract

A path risk evaluating apparatus includes a secondary collision likelihood direction evaluating unit () and a secondary collision likelihood distance evaluating unit () which evaluate, based on the relationship between a movement path and a position of objects in an environment where a mobile device moves, the likelihood of the mobile device having primary collision with a first object and the first object further having secondary collision with a second object; a risky attribute combination evaluating unit () which determines degree of damage when secondary collision occurs, by referring to information, indicating degree of damage when objects in the environment collide, held by a risky attribute combination information holding unit (); and a path evaluating unit () which evaluates the risk of the moving path for the mobile device, based on the evaluation result from the secondary collision likelihood direction evaluating unit () and the secondary collision likelihood distance evaluating unit () and the degree of damage determined by the risky attribute combination evaluating unit ().


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