The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7844124 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 30, 2010

Filed:

May. 11, 2007
Applicant:

Fang-chen Chang, Tainan County, TW;

Inventor:

Fang-Chen Chang, Tainan County, TW;

Assignee:

Himax Technologies Limited, Sinshih Township, Tainan County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 7/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of estimating a quantization parameter is provided. The method is applied to a de-blocking filter. The de-blocking filter de-blocks a decoded block-based image according to the quantization parameter, and the block-based image is coded and decoded in units of macroblocks. The method comprises calculating blocking degrees of a number of block edges corresponding to the macroblocks; and estimating the quantization parameter according to a sum of the blocking degrees.


Find Patent Forward Citations

Chang, Fang-Chen. (2010). Method of estimating a quantization parameter (U.S. Patent No. 7844124). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7844124

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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