The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2010
Filed:
Jul. 01, 2009
Xing LI, Webster, NY (US);
Barbara Farrell, Ontario, NY (US);
Peter Mccandlish, Rochester, NY (US);
Ryan Metcalfe, Marion, NY (US);
Xing Li, Webster, NY (US);
Barbara Farrell, Ontario, NY (US);
Peter McCandlish, Rochester, NY (US);
Ryan Metcalfe, Marion, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
Disclosed herein is a method for detecting thin lines in image data. The method is performed by a processor to process contone image data. The processing includes combining a first result of thin line detection using a first method and a second result of thin line detection using a second method to produce an improved thin line determination in the image data. The methods include processing and thresholding in the contone and binary domain to determine if a thin line exists in the window of image data. The thin line determination may also be merged with the image data as processed using other image segmentation techniques. The disclosed method produces better quality output images and reduces the addition of false lines in an image.