The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

Apr. 29, 2005
Applicants:

Andrew G. Jeung, Mountain View, CA (US);

Hassan Mostafavi, Los Altos, CA (US);

Alexander Sloutsky, Burlingame, CA (US);

Inventors:

Andrew G. Jeung, Mountain View, CA (US);

Hassan Mostafavi, Los Altos, CA (US);

Alexander Sloutsky, Burlingame, CA (US);

Assignee:

Varian Medical Systems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of determining a geometric parameter of a machine includes using the machine to obtain an image of at least a portion of a structure, the structure having a plurality of markers, wherein the markers have predetermined position(s) relative to each other, determining a position of the structure based on a pattern of the markers in the image, and determining a geometric parameter of the machine based at least in part on the determined position of the structure.


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