The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

Oct. 16, 2008
Applicants:

Mark E. Vermilyea, Niskayuna, NY (US);

Colin R. Wilson, Niskayuna, NY (US);

Yun Zou, Clifton Park, NY (US);

Inventors:

Mark E. Vermilyea, Niskayuna, NY (US);

Colin R. Wilson, Niskayuna, NY (US);

Yun Zou, Clifton Park, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A collimator includes a first plate having an aperture therein, the aperture configured to allow passage of a beam of x-rays from a source of a multi-spot source therethrough, and a second plate parallelly positioned with respect to the first plate and configured to receive and attenuate a first portion of the beam of x-rays passing through the aperture in the first plate, the second plate having an aperture therein configured to non-concentrically overlap the aperture in the first plate, to receive a second portion of the beam of x-rays passing through the aperture in the first plate, and to allow passage of the second portion of the beam of x-rays therethrough. A portion of the aperture in the first plate and a portion of the aperture in the second plate form a composite aperture parallel to the beam of x-rays, the composite aperture configured to allow passage of the second portion of the beam of x-rays through the first and second plates.


Find Patent Forward Citations

Loading…