The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

Nov. 02, 2006
Applicants:

Seung Keun Park, Daejeon, KR;

Jin a Park, Daejeon, KR;

Pyung Dong Cho, Daejeon, KR;

Hyeong Ho Lee, Daejeon, KR;

Inventors:

Seung Keun Park, Daejeon, KR;

Jin A Park, Daejeon, KR;

Pyung Dong Cho, Daejeon, KR;

Hyeong Ho Lee, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 27/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for improving a symbol error rate of an M-ary phase shift keying (M-PSK) system having a quadrature error are provided. The apparatus includes: a conversion parameter detector that detects a conversion parameter and converts a symbol decision region using the quadrature error and at least one pair of first received symbols; and a converter & determiner converting a pair of second received symbols using the detected conversion parameter, and determining a transmission symbol according to a symbol of the converted pair of second received symbols. An increase in a symbol error rate due to the quadrature error can be prevented and the quadrature error can be easily estimated.


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