The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2010
Filed:
Dec. 19, 2005
Applicants:
Vasudev Bhaskaran, Sunnyvale, CA (US);
William Chen, Foster City, CA (US);
Inventors:
Vasudev Bhaskaran, Sunnyvale, CA (US);
William Chen, Foster City, CA (US);
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 11/04 (2006.01); H04N 7/12 (2006.01);
U.S. Cl.
CPC ...
Abstract
The temporal and/or spatial characteristics of a macroblock are analyzed in order to reduce the number of modes for which motion estimation and rate distortion efficiency calculations are to be performed. In one embodiment, macroblock mean and variance characteristics are analyzed to merge sub-blocks together within the macroblock. These merged sub-blocks may be used to identify both inter and intra modes for the macroblock.