The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2010
Filed:
Aug. 20, 2008
Vanko Vankov, San Francisco, CA (US);
Arun Pasupathy, Gaithersburg, MD (US);
Vinod Jeyachandran, Rockville, MD (US);
Pradeep K. Singh, McLean, VA (US);
Alain J. Cohen, McLean, VA (US);
Yonghuan Cao, Morrisville, NC (US);
Vanko Vankov, San Francisco, CA (US);
Arun Pasupathy, Gaithersburg, MD (US);
Vinod Jeyachandran, Rockville, MD (US);
Pradeep K. Singh, McLean, VA (US);
Alain J. Cohen, McLean, VA (US);
Yonghuan Cao, Morrisville, NC (US);
OPNET Technologies, Inc., Bethesda, MD (US);
Abstract
First-order effects of hypothesized fault conditions are determined by propagating discrete test packets between select nodes and noting the change of path, if any, taken by the test packet under each condition relative to the fault-free path. Tools are provided to create classes of node pairs of interest, and test packets are created only for select classes. The network is analyzed to identify fault conditions that are likely to impact system performance, and only these fault conditions are simulated. By providing a methodology for selecting classes of node pairs to test, and prioritizing the faults to simulate, a first-order survivability analysis of large networks can be performed efficiently and effectively. The efficiency of this technique is also enhanced by providing test packets that are representative of a wide range of possible source-destination combinations, and by evaluating only the source-destination combinations that may be directly affected by each fault condition.