The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2010
Filed:
Sep. 06, 2007
Steven John Miener, Florissant, MO (US);
Kevin Lee Brown, Saint Peters, MO (US);
Steven John Miener, Florissant, MO (US);
Kevin Lee Brown, Saint Peters, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method and apparatus for inspecting transparent materials. An optical inspection apparatus comprises a prism, a mirror, and a light source. The prism has a first end, a first side, and a second side. The first side is opposite the second side, the first end is located between the first side and the second side, the first end has an angled surface, and the prism is capable of bending light. The first side is around parallel to the second side. The mirror is on the angled surface. The mirror is capable of redirecting light entering the prism on the first side along a directed line of sight to the second side along a line of sight to a viewer. The light source is attached to another surface on the first end. The light source is capable of transmitting light through the prism along the directed line of sight.