The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

Aug. 21, 2008
Applicants:

Richard S. Harner, Midland, MI (US);

J. Keith Harris, Midland, MI (US);

William A. Heeschen, Midland, MI (US);

Mary Beth Seasholtz, Sanford, MI (US);

Inventors:

Richard S. Harner, Midland, MI (US);

J. Keith Harris, Midland, MI (US);

William A. Heeschen, Midland, MI (US);

Mary Beth Seasholtz, Sanford, MI (US);

Assignee:

Dow Global Technologies Inc., Midland, MI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a turbidity calibration standard comprising: a number of from 1 to 5 sequentially-interfaced layers, wherein each layer independently comprises a light-permeable polymer or light-permeable interpolymer; a measured light transmission modulating amount of at least one light transmission modulator, which is distributed in any one or more of the layers; and a light-permeable container, which contains the layers and the at least one light transmission modulator. Also, the invention relates to methods of making and using the standard, and kits comprising the standard.


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