The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2010
Filed:
Sep. 28, 2006
Marko Hahn, Neubiberg, DE;
Markus Schu, Erding, DE;
Marko Hahn, Neubiberg, DE;
Markus Schu, Erding, DE;
Trident Microsystems (Far East) Ltd., Grand Cayman, KY;
Abstract
The invention relates to an iterative method for determining an interpolated image information value in an image that comprises a number of image regions arranged in a matrix-like fashion having original image regions to which one image information value has been assigned, and having at least one image region to be interpolated. In order to determine an interpolated image information value, the method specifies a starting interpolation direction and determines a quality measure for the starting interpolation direction. At least one image direction is selected different from the starting interpolation direction and determining a quality measure for this at least one image direction. The quality measures for the starting interpolation direction are compared and the at least one image direction different from the starting interpolation direction, selecting as the interpolation direction the starting interpolation direction or the at least one image direction, and determining the interpolated image information value using image regions that are located in the interpolation direction adjacent to the to-be-interpolated first image region. The steps of selecting and comparing are repeated at least once.