The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

Jan. 17, 2006
Applicants:

Huangpin Ben Hsieh, Mountain View, CA (US);

Nicole H. Lazarus, Sonoma, CA (US);

Robert T. Krivacic, San Jose, CA (US);

Douglas N. Curry, Palo Alto, CA (US);

Richard H. Bruce, Los Altos, CA (US);

Inventors:

Huangpin Ben Hsieh, Mountain View, CA (US);

Nicole H. Lazarus, Sonoma, CA (US);

Robert T. Krivacic, San Jose, CA (US);

Douglas N. Curry, Palo Alto, CA (US);

Richard H. Bruce, Los Altos, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is provided for preparing a sample containing potential cells of interest and of using a laser of a laser based system for novel excitation and emission collection, and data usage including use of obtained data for direct and ratio based measurements. The prepared sample is configured to emit signals having spectral characteristics sufficient to permit filtering to differentiate and eliminate most false positives from true positives among acquired imaging events, in an imaging system employing a laser spot having a range of diameters from 1 to 20 μm or greater and which excites the fluorescence in a conventional or novel manner. These filtered events may be subsequently imaged and confirmed with another higher resolution device such as a fluorescent microscope in a short amount of time.


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