The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

Nov. 13, 2008
Applicants:

Yuichi Nishii, Tokyo, JP;

Masahiro Abe, Yamato, JP;

Hideto Shiozawa, Suwa, JP;

Tsukasa Sako, Yokohama, JP;

Inventors:

Yuichi Nishii, Tokyo, JP;

Masahiro Abe, Yamato, JP;

Hideto Shiozawa, Suwa, JP;

Tsukasa Sako, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging apparatus in which positions of an X-ray image and optical image of a subject can be brought into registration with each other is provided. A half-mirror is provided between the X-ray source and subject and is configured to pass X-rays and reflect visible light. A TV camera captures the optical image of the surface of the subject reflected by the half-mirror. A display unit displays the optical image captured by the TV camera together with a reference mark indicating the reference position of this optical image, and displays, in superimposed form, an X-ray image obtained by capturing a prescribed reference object as a subject by using an X-ray imaging unit. An adjusting unit adjusts position and attitude of an X-ray detector in such a manner that the reference object displayed by the display unit will coincide with the reference mark.


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