The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2010

Filed:

May. 29, 2008
Applicants:

Ean-sue Lee, Taipei, TW;

Po-yin Chao, Taipei, TW;

Inventors:

Ean-Sue Lee, Taipei, TW;

Po-Yin Chao, Taipei, TW;

Assignee:

Hycon Technology Corp., Danshui Town, Taipei County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 7/00 (2006.01); H01L 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A temperature measuring system and a measuring method using the same are disclosed. The method for measuring an integrated circuit temperature includes the steps of: detecting a first difference in output voltage values between a first transistor and a second transistor by providing a first current through the first transistor and a second current through the second transistor; detecting a second difference in output voltage values between the first transistor and the second transistor by providing the second current through the first transistor and the first current through the second transistor; obtaining an average value by averaging the first difference and the second difference; and determining the temperature by multiplying the average value with a predetermined value.


Find Patent Forward Citations

Lee, Ean-Sue. (2010). Temperature measuring system and measuring method using the same (U.S. Patent No. 7841770). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7841770

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