The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 2010
Filed:
Jan. 24, 2008
Adrian G. H. Podoleanu, Canterbury, GB;
Adrian G. H. Podoleanu, Canterbury, GB;
Abstract
A method of determining the external three dimensional external contour of a curved object in one step, which produces and processes a single composite en-face OCT image (a C-scan), which involves generating and processing a set of two dimensional image contours of the object in different image planes using a plurality of optical path lengths in an OCT system with all such contours present in the composite en-face OCT image. The multiple path lengths are generated using a multiple delay element in bulk or in fiber inserted in the path from the source to the OCT system or in one of the OCT arms. The image planes have a known spatial relationship with each other. The three dimensional external contour of the curved object is computed from the two dimensional contours in the composite en-face OCT image and the known spatial relationship between the image planes. Axial position and tilt of a sample are evaluated using an optimum shape object attached to the sample in one step, by processing a s composite en-face OCT image generated by using a plurality of optical path delays.