The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

Mar. 30, 2006
Applicants:

Ian Tien, Seattle, WA (US);

Chen-i Lim, Bellevue, WA (US);

Corey Hulen, Sammamish, WA (US);

Inventors:

Ian Tien, Seattle, WA (US);

Chen-I Lim, Bellevue, WA (US);

Corey Hulen, Sammamish, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Groups of subordinate report definitions are determined for selected scorecard metrics based on suitable report type and layout features. A list comprising the available reports is assigned to each source metric enabling association of the groups across metrics. A context of the scorecard is passed to a physical instantiation of the group of reports to affect their behavior. Report presentation, queries, and the like may be performed using the assigned definition list(s).


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Tien, Ian. (2010). Definition and instantiation of metric based business logic reports (U.S. Patent No. 7840896). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7840896

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