The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
Dec. 10, 2009
Applicants:
Gary D. Grise, Colchester, VT (US);
Steven F. Oakland, Colchester, VT (US);
Anthony D. Polson, Jericho, VT (US);
Philip S. Stevens, Williston, VT (US);
Inventors:
Gary D. Grise, Colchester, VT (US);
Steven F. Oakland, Colchester, VT (US);
Anthony D. Polson, Jericho, VT (US);
Philip S. Stevens, Williston, VT (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 1/12 (2006.01); G06F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and circuits for testing an integrated circuit at functional clock frequency by providing a test controller generating control signals that assure proper latching of test patterns in scan chains at tester frequency and propagation of the test pattern through logic circuits being tested at functional clock frequency.