The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
Aug. 12, 2005
Jason L. Copenhaver, Sarasota, FL (US);
Ramos Jeremy, Clearwater, FL (US);
Jeffrey M. Wolfe, Parrish, FL (US);
Dean Brenner, Largo, FL (US);
Jason L. Copenhaver, Sarasota, FL (US);
Ramos Jeremy, Clearwater, FL (US);
Jeffrey M. Wolfe, Parrish, FL (US);
Dean Brenner, Largo, FL (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
A method and system for adapting fault tolerant computing. The method includes the steps of measuring an environmental condition representative of an environment. An on-board processing system's sensitivity to the measured environmental condition is measured. It is determined whether to reconfigure a fault tolerance of the on-board processing system based in part on the measured environmental condition. The fault tolerance of the on-board processing system may be reconfigured based in part on the measured environmental condition.