The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

Apr. 04, 2003
Applicants:

Dwaine Clarke, Christ Church, BB;

Blaise Gassend, San Carlos, CA (US);

Marten Van Dijk, Cambridge, MA (US);

Srinivas Devadas, Lexington, MA (US);

Inventors:

Dwaine Clarke, Christ Church, BB;

Blaise Gassend, San Carlos, CA (US);

Marten Van Dijk, Cambridge, MA (US);

Srinivas Devadas, Lexington, MA (US);

Assignees:

Massachusetts Institute of Technology, Cambridge, MA (US);

Intrinsic ID B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 29/00 (2006.01); G06F 21/02 (2006.01); H01L 23/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

A group of devices are fabricated based on a common design, each device having a corresponding plurality of measurable characteristics that is unique in the group to that device, each device having a measurement module for measuring the measurable characteristics. Authentication of one of the group of devices is enabled by selective measurement of one or more of the plurality of measurable characteristics of the device.


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