The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
May. 30, 2007
Applicants:
James C. Culp, Pleasanton, CA (US);
Craig E. Farren, Livermore, CA (US);
Artem Borovinskih, San Jose, CA (US);
Eric Kuo, Foster City, CA (US);
Inventors:
James C. Culp, Pleasanton, CA (US);
Craig E. Farren, Livermore, CA (US);
Artem Borovinskih, San Jose, CA (US);
Eric Kuo, Foster City, CA (US);
Assignee:
Align Technology, Inc., Santa Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and associated method for selecting or creating an area which meets meet a set of marking criteria, for example, corresponding to a minimum surface area; a maximum slope angle; and a minimum deviation from a specified height. A marking station is directed to mark the selected area that meets the marking criteria.