The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
Nov. 28, 2007
Francis Howard Little, Cincinnati, OH (US);
Yanyan Wu, Schenectady, NY (US);
Prabhjot Singh, Guilderland, NY (US);
Francis Howard Little, Cincinnati, OH (US);
Yanyan Wu, Schenectady, NY (US);
Prabhjot Singh, Guilderland, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.