The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
Oct. 07, 2005
Armin Schmiegel, Hamburg, DE;
Marc Schwarze, Ahlerstedt, DE;
Armin Schmiegel, Hamburg, DE;
Marc Schwarze, Ahlerstedt, DE;
Morpho Detection, Inc., Newark, CA (US);
Abstract
A method for determining the change in position of an object in an item of luggage using two X-ray images. The method includes allocating points to individual features in each X-ray image, and extracting the individual features to produce a set of extracted points for each X-ray image. The method includes searching for clusters in each set of extracted points. For each X-ray image a valuation function that displays different values when points of a cluster are close than when points of the cluster are not close is used to determine the proximity of each cluster. This permits analysis of the movement of the object to be performed by observing the proximities of the clusters.