The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
Dec. 31, 2007
Joseph Bendahan, San Jose, CA (US);
Walter Irving Garms, Berkeley, CA (US);
Mengqian Gu, Newark, CA (US);
Joseph Bendahan, San Jose, CA (US);
Walter Irving Garms, Berkeley, CA (US);
Mengqian Gu, Newark, CA (US);
Morpho Detection, Inc., Newark, CA (US);
Abstract
A method for automatically inspecting a container for a target material using a computed tomography (CT) scanning system includes performing an initial radiographic scan of the container. Based at least partially on projection data generated during the initial radiographic scan, at least one location within the container is identified that requires CT inspection. A dual energy CT scan of the at least one identified location within the container is performed based on a single energy algorithm or a dual energy algorithm. The dual energy CT scan includes a low energy scan of the at least one identified location and a high energy scan of the at least one identified location. Based on dual energy scan information generated during the dual energy CT scan, a determination is made to confirm or clear an alarm corresponding to the at least one identified location within the container.