The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

Dec. 26, 2006
Applicants:

Pantas Sutardja, Los Gatos, CA (US);

William R. Foland, Jr., Littleton, CO (US);

Inventors:

Pantas Sutardja, Los Gatos, CA (US);

William R. Foland, Jr., Littleton, CO (US);

Assignee:

Marvell World Trade Ltd., St. Michael, BB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 15/52 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, software, and apparatus for the calibration of writing characteristics for writing to an optical storage medium, and methods of encoding calibration pattern data and calibration instructions are disclosed. The method of calibration generally includes the steps of (a) receiving pattern data and instructions synchronized with the pattern data, (b) writing the pattern data to the optical storage medium in accordance with the instructions, (c) reading a readback signal corresponding to the pattern data from the optical storage medium, (d) processing the readback signal in accordance with the instructions, and (e) determining a value of a writing characteristic for writing data to the optical storage medium based at least in part on the readback signal. The method provides the ability to flexibly set test parameters and to quickly and accurately test the write characteristics of a recordable or re-writable optical storage medium.


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