The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

Mar. 06, 2007
Applicants:

Junji Miura, Naka-gun, JP;

Takahisa Nakano, Yokohama, JP;

Inventors:

Junji Miura, Naka-gun, JP;

Takahisa Nakano, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03H 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An inspection apparatus includes a light source unit which irradiates illumination light onto a hologram of a medium from a predetermined direction at which diffraction light from the hologram is obtained, a first light receiving member which receives the diffraction light from the hologram, a second light receiving member which receives transmitted part of illumination light irradiated onto the hologram, having passed through the medium, and an identification processing unit which identifies authenticity of the hologram from the diffraction light received by the first light receiving member and identifies a defect of the hologram from the transmitted light received by the second light receiving member.


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