The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

Mar. 05, 2008
Applicants:

Takeo Nishikawa, Kyotanabe, JP;

Tomohiko Matsushita, Kyoto, JP;

Hideyuki Yamashita, Daito, JP;

Ryosuke Hasui, Nara, JP;

Satoshi Fujita, Nara, JP;

Yutaro Okuno, Kyoto, JP;

Shigeru Aoyama, Kizugawa, JP;

Inventors:

Takeo Nishikawa, Kyotanabe, JP;

Tomohiko Matsushita, Kyoto, JP;

Hideyuki Yamashita, Daito, JP;

Ryosuke Hasui, Nara, JP;

Satoshi Fujita, Nara, JP;

Yutaro Okuno, Kyoto, JP;

Shigeru Aoyama, Kizugawa, JP;

Assignee:

OMRON Corporation, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sensor chip has a metal layer formed on a surface of a substrate, where a plurality of microscopic concave part is formed in a measurement region of the surface of the metal layer. When light of linear polarization is irradiated onto the measurement region, local resonance electric field generates at opposing metal layer surfaces in the concave part. The reflected light thereof is received to measure reflectance. The light of linear polarization is irradiated so that the polarizing surface becomes orthogonal to the longitudinal direction of the concave part.


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