The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

Aug. 29, 2008
Applicants:

Hisamitsu Kameshima, Tokyo, JP;

Tomo Yoshinari, Tokyo, JP;

Yusuke Tochigi, Tokyo, JP;

Kae Takahashi, Tokyo, JP;

Takahiro Morinaga, Tokyo, JP;

Inventors:

Hisamitsu Kameshima, Tokyo, JP;

Tomo Yoshinari, Tokyo, JP;

Yusuke Tochigi, Tokyo, JP;

Kae Takahashi, Tokyo, JP;

Takahiro Morinaga, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); B32B 5/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

An antiglare film includes an antiglare layer having particles and a binder matrix on a transparent base material. An antiglare film surface on the antiglare layer side has a concave-convex structure with a ten-point average roughness (Rz) equal to or larger than 0.08 μm and equal to or smaller than 0.10 μm at a cutoff wavelength (λ) of 0.008 mm, the antiglare film surface on the antiglare layer side has a concave-convex structure with a ten-point average roughness (Rz) equal to or larger than 1.90 μm and equal to or smaller than 2.50 μm at a cutoff wavelength (λ) of 0.8 mm, and the antiglare film surface on the antiglare layer side has a concave-convex structure with an average spacing (S) between local peaks equal to or larger than 0.033 mm and equal to or smaller than 0.050 mm at a cutoff wavelength (λ) of 0.8 mm.


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