The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

Aug. 08, 2005
Applicants:

Tatsuya Ishii, Fujimi-cho, JP;

Shigefumi Yamaji, Chitose, JP;

Koichi Mizugaki, Suwa, JP;

Inventors:

Tatsuya Ishii, Fujimi-cho, JP;

Shigefumi Yamaji, Chitose, JP;

Koichi Mizugaki, Suwa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electrooptic apparatus substrate and examination method therefor can be provided which can implement an examination without requiring bringing a probe into contact thereto from the outside and with satisfactory measuring accuracy. A substrateof the present invention includes a video lineand transmission date portionthrough multiple switching elements for writing a first potential signal in multiple pixels through a signal line. The substratefurther includes a display data reading circuit portionhaving a differential amplifierfor lowering a lower potential and heightening a higher potential and outputting it to the signal line and a transmission gate portionand video linefor reading the first potential signal and a reference second potential signal.


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