The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

Apr. 18, 2006
Applicants:

Junichi Kurita, Osaka, JP;

Hiroshi Higashitani, Osaka, JP;

Kazuo Kawahito, Osaka, JP;

Tsuyoshi Yoshino, Kyoto, JP;

Inventors:

Junichi Kurita, Osaka, JP;

Hiroshi Higashitani, Osaka, JP;

Kazuo Kawahito, Osaka, JP;

Tsuyoshi Yoshino, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A capacitor inspection device includes a substrate made of an insulating material, a first conductor unit and a second conductor unit arranged on the substrate, a signal input unit and a signal output unit attached to the substrate, a network analyzer and a pressurizing unit. The network analyzer has an input port connected to the signal input unit and an output port connected to the signal output unit. The first and second conductor units make contact with an anode and a cathode of a capacitor, respectively. The pressurizing unit presses the anode of capacitor onto the first conductor unit and the cathode onto the second conductor unit.


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