The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
Jan. 04, 2007
Kyu-sang Lee, Yongin-si, KR;
Kyu-tae Yoo, Yongin-si, KR;
Jeo-young Shim, Yongin-si, KR;
Won-seok Chung, Yongin-si, KR;
Yeon-ja Cho, Yongin-si, KR;
Kyu-sang Lee, Yongin-si, KR;
Kyu-tae Yoo, Yongin-si, KR;
Jeo-young Shim, Yongin-si, KR;
Won-seok Chung, Yongin-si, KR;
Yeon-ja Cho, Yongin-si, KR;
Abstract
A method for simultaneously detecting a size and concentration of ionic materials includes measuring voltage drop values of at least three ionic materials of which sizes and concentrations are known using each of at least two FET-based sensors having different electrical characteristics, determining at least three points in a three-dimensional plot from the known sizes, concentrations and the measured voltage drop values, approximating the at least three points into a single plane, measuring a voltage drop value of an ionic material of which size and concentration are unknown using the at least two FET-based sensors, determining equipotential lines existing on the plane using the voltage drop value of the unknown ionic material and determining a cross point between each of the equipotential lines.