The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
Feb. 01, 2008
Xiaowei Zhuang, Cambridge, MA (US);
Wilfred M. Bates, Somerville, MA (US);
Michael J. Rust, Medford, MA (US);
BO Huang, Somerville, MA (US);
Xiaowei Zhuang, Cambridge, MA (US);
Wilfred M. Bates, Somerville, MA (US);
Michael J. Rust, Medford, MA (US);
Bo Huang, Somerville, MA (US);
President and Fellows of Harvard College, Cambridge, MA (US);
Abstract
The present invention generally relates to sub-diffraction limit image resolution. In one aspect, the invention is directed to determining and/or imaging light from two or more entities separated by a distance less than the diffraction limit of the incident light. In one set of embodiments, the entities may be selectively activatable, i.e., one entity can be activated to produce light, without activating other entities. The emitted light may be used to determine the positions of the first and second entities, for example, using Gaussian fitting or other mathematical techniques, and in some cases, with sub-diffraction limit resolution. The methods may thus be used, for example, to determine the locations of two or more entities immobilized relative to a common entity, for example, a surface, or a biological entity such as DNA, a protein, a cell, a tissue, etc.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile