The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2010

Filed:

Jun. 07, 2007
Applicants:

Charles D. Lang, Goleta, CA (US);

Nigel Morton Coe, Santa Barbara, CA (US);

Stephen Sorich, Goleta, CA (US);

Nageswara Rao Tadepalli, Goleta, CA (US);

Inventors:

Charles D. Lang, Goleta, CA (US);

Nigel Morton Coe, Santa Barbara, CA (US);

Stephen Sorich, Goleta, CA (US);

Nageswara Rao Tadepalli, Goleta, CA (US);

Assignee:

E. I. du Pont de Nemours and Company, Wilimington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01); G03F 7/004 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided an essentially planar test substrate for non-contact printing. The substrate has a first layer having a first surface energy and having a planar measurement portion. A liquid containment pattern is over at least the measurement portion of the first layer. The liquid containment pattern has a second surface energy that is different from the first surface energy. The measurement portion of the first layer and the liquid containment pattern together are substantially planar.


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