The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
Mar. 05, 2009
W. Robert Nelson, Wichita, KS (US);
C. Tim Harbaugh, Derby, KS (US);
W. Robert Nelson, Wichita, KS (US);
C. Tim Harbaugh, Derby, KS (US);
Spirit AeroSystems, Inc., Wichita, KS (US);
Abstract
An apparatus for inspecting samples that may include a curvature that varies from sample to sample comprises a scanning element, a feed mechanism, and a pivot mechanism. The scanning element transmits and receives a signal to and from the sample as the sample passes by, thereby building an image or profile of the sample. The feed mechanism includes a drive motor coupled to a series of pulleys and belts that form an open-ended chain. The pulleys rotate when driven by the drive motor and are coupled to an array of rollers that rotate as well to propel a inspection sample past the scanning element. The pivot mechanism includes a series of primary and secondary links that also form an open-ended chain. The primary links are coupled to the rollers and the combination pivots in unison to form an arc that matches the curvature of the sample in order to maintain a fixed distance between the sample and the scanning element.