The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2010

Filed:

Jul. 03, 2007
Applicants:

Xiaoming Zhao, Nanjing, CN;

Gang Chen, Nanjing, CN;

Eric Chang, Taipei, TW;

Inventors:

Xiaoming Zhao, Nanjing, CN;

Gang Chen, Nanjing, CN;

Eric Chang, Taipei, TW;

Assignee:

Trend Micro Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for performing content analysis of a plurality of resources is provided. The method includes performing background content scanning on the plurality of resources based on a resource priority queue. The method also includes storing already scanned resources of the plurality of resources in a scan result database. The method further includes receiving a first access request asynchronously with the scanning and the storing. The method yet also includes, if the first access request pertains to a given resource not contemporaneously designated as a satisfactory scan result according to the scan result database, granting the given resource a higher priority in the resource priority queue than resources remaining to be scanned in the plurality of resources, thereby enabling the given resource to be scanned ahead of the resources remaining to be scanned.


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