The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Mar. 05, 2008
Applicants:
Tomoki Satoi, Kanagawa-ken, JP;
Naohiko Nishigaki, Kanagawa-ken, JP;
Inventors:
Tomoki Satoi, Kanagawa-ken, JP;
Naohiko Nishigaki, Kanagawa-ken, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A SCAN test circuit for giving a semiconductor integration circuit a scan test includes a scan enable signal generating device that generates scan enable signals based on a scan enable external input signal, a clock generator that generate launch and capture clocks for collectively detecting a delay malfunction at a practical operation speed, and a controller configured to control the clock generator based on the scan enable signals.