The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2010
Filed:
Aug. 21, 2006
Applicants:
Trieu C. Chieu, Scarsdale, NY (US);
Hoi Y. Chan, New Canaan, CT (US);
Vinod Kamath, Raleigh, NC (US);
Lawrence S. Mok, Brewster, NY (US);
Inventors:
Trieu C. Chieu, Scarsdale, NY (US);
Hoi Y. Chan, New Canaan, CT (US);
Vinod Kamath, Raleigh, NC (US);
Lawrence S. Mok, Brewster, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method, system and computer readable medium for maximizing the performance of a computer system that includes at least one computing unit. Temperature and location data for each computing unit is received by a server unit and the location of each computing unit within a given environment is reevaluated and revised to maximize the overall performance of the computer system.