The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2010

Filed:

Mar. 31, 2008
Applicants:

Chao-wei Ou, Poughkeepsie, NY (US);

Prasanna Patil, Elmsford, NY (US);

Lida He, Sleepy Hollow, NY (US);

William Kuhhirte, Redington Shores, FL (US);

Inventors:

Chao-Wei Ou, Poughkeepsie, NY (US);

Prasanna Patil, Elmsford, NY (US);

Lida He, Sleepy Hollow, NY (US);

William Kuhhirte, Redington Shores, FL (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A generic analysis model is applicable to a variety of network infrastructure domains, and operable for causal analysis in a common manner independently of the corresponding underlying domain. The generic analysis model may be employed to model root cause analysis and impact analysis for different resource management systems such as enterprise networks, storage area networks, service provider networks and business process management. Such a model improves performance and scalability by simplifying analysis model for a given solution, and decouples the development from topology building and analysis implementation.


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